Are you seeking to achieve dramatic gains in product time to market? This webinar will explore the combined solution of proteanTecs deep data analytics solutions and the PDF Solutions Exensio platform for rapid NPI.
This 30-minute program includes a presentation and a LIVE DEMO of the integration of PDF Solutions' Exensio platform and proteanTecs' deep data analytics platform. Our collaboration combines PDF Solutions’ semiconductor big data analytics solutions with proteanTecs’ deep data offering for chip and system lifecycle analytics to enable data-driven actionable insights for device centering, design margin assessment, yield limiter detection, test tool debug and excursions correction.
The webinar covers how integrated end-to-end analytics:
- Accelerate learning for NPI and early ramp
- Provide drill-down diagnostics from lots to device subsystems
- Improve test understanding for device characterization
Key topics covered:
- Design validation visibility with Agents and analytics assessing chip health at every stage
- Analytics tool from fab through device testing
- Design validation enabling data fusion for in-die visibility, analytics and machine learning
- Faster validation by accelerated use of data
- Actual use cases
Speakers
- Tami Shlasky Nachalon is VP of Product Management at proteanTecs. Tami has 15 years of experience in various product positions in big data analytics B2B companies, both startups & corporates. Prior to proteanTecs, Tami was a Chief Product Planner in Optimal Plus, which was acquired by National Instruments. Tami holds a B.Sc in Industrial Engineering & Management from Ben Gurion University, and an MBA in Management & Entrepreneurship from Tel Aviv University.
Thomas Zanon is an Engagement Director at PDF Solutions with 15+ years in the semiconductor industry. He's a technical lead for partner collaborations, specializing in Bitmap, DFI, and yield ramp projects with IDMs and fabless companies. Thomas holds a Dipl. Ing. in Electrical Engineering and Information Technology from the Technical University in Munich and a Ph.D. in Electrical Engineering from Carnegie Mellon University in Pittsburgh, PA.
