Classification and Profiling

Classification of chips into "Families", which are groups of chips that have similar parametric behavior. Their characteristics are maintained across voltage and temperature conditions and while chips undergo transformations: on a wafer, packaged, or assembled on a system. "Family invariance" serves as an intrinsic basis for correlation, yield and quality improvements and fast, accurate performance binning.

Performance & Degradation Monitoring

Delay measurements of billions of paths, in parallel with normal operation, monitor performance at real application and degradation patterns. The Agents detect potential failures stemming from aging, reliability issues, latent defects that develop over time, environment and workload effects.

Operational Sensing

Detect events caused by device operation or environment and explain performance health source. Operational level fusion with performance monitoring and Family association provides unprecedented coverage and early pinpointed indication of hazards.

Can be enhanced with proprietary customer monitor & sensor data.